JCH Phang, WK Chim, DSH Chan and YY LIU,

“A Retractable Cathodoluminescence Detector With High Ellipticity and High Backscattered Electron Rejection Performance for Large Area Specimens”

US Patent No. 5,569,920 (Date of Patent: October 29, 1996).

WK Chim, DSH Chan, JCH Phang, JM Tao and YY LIU,

“Integrated Emission Microscope for Panchromatic Imaging, Continuous Wavelength Spectroscopy and Selective Area Spectroscopic Mapping”

US Patent No. 5,724,131 (Date of Patent: March 3, 1998).

YY Liu,

“A Novel Remote And Powerless Pump Head System”

US Provisional Patent Appl. No. 60/470,878 (Filed in the US on May 16, 2003).

YY Liu, DSH Chan and JCH Phang,

“Rotational Stage For High Speed, Large Area Scanning In Focused Beam Systems”

US Patent No. 6,777,688 B2 (Date of Patent: August 17, 2004).

YY Liu, DSH Chan and JCH Phang,

“Optical Reflector And Optical Collection System”

US Patent Appl. Pub. No. US 2006/0060189 A1 (Pub. Date: Mar 23, 2006).

YY Liu, CH Lou,

“Microscope Having Multiple Image-Outputting Devices And Probing Apparatus For Integrated Circuit Devices Using The Same”

US Patent Appl. Pub. No. US 2010/0118297 A1 (Pub. Date: May 13, 2010).

YY Liu,

“High Speed Probing Apparatus For Semiconductor Devices And Probe Stage For The Same”

US Patent No. 7,986,157 B1 (Date of Patent: Jul 26, 2011).

YY Liu, CL Lou, LP Chew,

“Probing Apparatus With On-Probe Device-Mapping Function”

US Patent No. 8,279,451 B2 (Date of Patent: Oct 2, 2012).

KL Pey, WK Chim, LS Koh, YY LIU and SYC Chew,

“An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes”

MICROELECTRON RELIAB, 35, No. 6 (1995): 935-946. (United Kingdom).

DSH Chan, JCH Phang, WK Chim, YY LIU and JM Tao,

“Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices”

REV SCI INSTRUM, 67, No. 7 (1996): 2576-2583. (United States).

JCH Phang, DSH Chan, WK Chim, YY LIU and X Liu,

“Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered rejection efficiency”

SOLID STATE PHENOM, 63, 4 (1998): 159-170.

R Heiderhoff, OV Sergeev, YY LIU, JCH Phang and LJ Balk,

“Comparison between standard and neaer-field cathodoluminescence”

J CRYST GROWTH, 210 (2000) 303-306.

Paper presented at The 8th International Conference on Defects – Recognition, Imaging and Physics in Semiconductors (DRIP – VIII), 15-18 September 1999, Narita, Japan.

Chan DSH, WK Chim, JCH Phang, YY LIU, TH Ng and H Xiao,

“Can physical analysis aid in device characterisation?”

J CRYST GROWTH, 210 (2000) 323-330.

Paper presented at The 8th International Conference on Defects – Recognition, Imaging and Physics in Semiconductors (DRIP – VIII), 15-18 September 1999, Narita, Japan. (Invited Paper)

Rau EI, Sennov RA, Dorofeev KY, Yagola AG, Liu YY, Phang JCH, Chan DSH

"The Fundamentals of Cathodoluminescence Microtomography Based on Confocal Mirror Optics" SURFACE: X-RAY, SYNCHOTRON & NEUTRON INVESTIGATIONS, RUSSIAN ACADEMY OF SCIENCE, MOSCOW, 10, PG 85-92 (2002).

DSH Chan, YY Liu, and JCH Phang, E Rau, R Sennov, and AV Gostev

“Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics”

REV SCI INSTRUM, 75, No 10, (Oct 2004): 3191-3199.

EJ Teo, AA Bettiol, T Osipowicz, M Hao, SJ Chua, YY Liu

“Depth-resolved luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescence”

J CRYST GROWTH, 268 (2004) 494–498.

LIU YY, JM Tao, DSH Chan, JCH Phang and WK Chim,

“A new spectroscopic photon emission microscope system for semiconductor device analysis”

In Proceedings of the 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 27 November - 1 December 1995, Raffles City Convention Centre, The Westin Hotel, Singapore, pp. 60-65. Singapore: Institute of Electrical and Electronics Engineers (IEEE), 1995.

Tao JM, WK Chim, DSH Chan, JCH Phang and YY LIU,

“A high-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability”

In Proceedings of the 34th Annual IEEE International Reliability Physics Symposium, 29 April - 2 May 1996, Wyndham Anatole Hotel, Dallas, Texas, United States, pp. 360-365. United States: Institute of Electrical and Electronics Engineers, Inc., 1996.

Wittpahl, V, YY LIU, DSH Chan, WK Chim, JCH Phang, LJ Balk and KP Yan,

“A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor”

In Proceedings of the 34th Annual IEEE International Reliability Physics Symposium, 29 April - 2 May 1996, Wyhdham Anatole Hotel, Dalles, Texas, United States, pp. 188-194. United States: Institute of Electrical and Electronics Engineers, Inc., 1996.

Tao, J M, WK Chim, DSH Chan, JCH Phang and YY LIU,

“Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope”

In Proceedings of the 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 21-25 July 1997, Singapore, pp. 33-38. Singapore: Institute of Electrical and Electronics Engineers, Inc., 1997.

Yang, C, T Osipowicz, F Watt, M Elfman, KG Malmqrist, YY Liu, JCH Phang, DSH Chan and WK Chim,

“Ionluminescence method for nuclear microscopy”

In Proceedings 1st ASEAN Microscopy Conference, 27-30 November 1997, Senai, Johore, Malaysia, pp. 190-192. Johore, 1997.

JCH Phang, DSH Chan, WK Chim, YY LIU and X Liu,

“Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered rejection efficiency”

In Proceedings 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS '98)||, 30 August - 3 September 1998, Parkhotel Schloss Wulkow, Wulkow near Berlin, Germany, edited by M Kitter, O Breitensten, A Endroes, W Schroeter, pp. 159-170. Switzerland: Sitec Publications Ltd, 1998. (Invited paper).

JCH Phang, WK Chim, YY LIU and DSH Chan,

“A novel cathodoluminescence detector with high collection and backscattered electron rejection efficiency”

In 7th Scientific Conference of the Electron Microscopy Society Malaysia, 27-28 November 1998, Veterinary Research Institute, Ipoh, Malaysia, pp. 5-11. Ipoh: University Sains Malaysia, 1998. (Invited Paper)

Ng TH, WK Chim, DSH Chan, JCH Phang, YY LIU, CL Lou, SE Leang and JM Tao,

“An integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis”

In Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 5-9 July 1999, Orchard Hotel, Singapore, pp. 113-118. Singapore: The Institute of Electrical and Electronics Engineers, Inc, July 1999.

Xiao H, YY LIU, JCH Phang, DSH Chan, WK Chim and KP Yan,

“Study on LED degradation using CL, EBIC and a two-diode parameter extraction model”

In Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 5-9 July 1999, Orchard Hotel, Singapore, pp. 180-184. Singapore: The Institute of Electrical and Electronics Engineers, Inc, July 1999.

R Heiderhoff, OV Sergeev, YY LIU, JCH Phang and LJ Balk,

“Comparison between standard and neaer-field cathodoluminescence”

J CRYST GROWTH, 210 (2000) 303-306.

Paper presented at The 8th International Conference on Defects – Recognition, Imaging and Physics in Semiconductors (DRIP – VIII), 15-18 September 1999, Narita, Japan.

Chan DSH, WK Chim, JCH Phang, YY LIU, TH Ng and H Xiao,

“Can physical analysis aid in device characterisation?”

J CRYST GROWTH, 210 (2000) 323-330.

Paper presented at The 8th International Conference on Defects – Recognition, Imaging and Physics in Semiconductors (DRIP – VIII), 15-18 September 1999, Narita, Japan. (Invited Paper)

EJ Teo, AA Bettiol, T Osipowicz, MS Hao, SJ Chua, YY Liu,

“Yellow Luminescence Imaging Of Epitaxial Lateral Overgrown GaN Using Ionoluminescence”

Mat. Res. Soc. Symp. Proc. Vol. 738 © 2003 Materials Research Society, G7.4.1-G7.4.6

Len WB, Liu YY, Phang JCH, Chan DSH,

“Near IR Continuous Wavelength Spectroscopy of Photon Emissions from Semiconductor

Devices”

In Proceedings of the 29th International Symposium for Testing and Failure Analysis, Published Oct 2003, Pages: 311-316, 2-6 November 2003, Santa Clara, California, USA.